The control box for the filament (and V1) was built by Dwinnel and Reuteler for a previous MXP project. For the initial beam calibration tests a NerdOTronix negative high voltage supply powered the control box. A Hewlett-Packard Harrison DC power supply gave the V2 voltage, while the V3 was powered by a Heathkit Regulated high voltage power supply. For the primary data runs, the HP supply was used for V1 and a Power Designs high voltage calibrated DC power source was used for V2.
Several times during the project, the gun was adjusted to eliminate shorts, arcs, and other troublesome behavior. During these repairs the filament often broke (the filament becomes very brittle after being used in the vacuum, and thus prone to breaking) and had to be replaced. See Appendix A for more information about the electron gun.

Calibration
To experimentally determine the optimal relationship between voltage settings, and to explore the beam properties at various distances from the gun, a phosphor screen was placed in the beam’s path within the chamber. A cable ran along the exterior of the chamber from the screen’s external connector to the exterior of the V1 voltage line into the gun, thereby grounding the screen and keeping it from building up any net charge.
By observing the beam diameter as a function of V2 (voltage on the middle cylinder) and V3-V1 (the combined voltage difference of the gun), the following relationship was determined
This is a fine first order approximation, but there is also pronounced second order effect, one which was characterized more effectively with the use of the SIMION program.

SIMION
This program made it possible to model the behavior of the electron gun and to visualize the effects of different voltages on the performance of the gun. The first step in utilizing the software was to “build” the gun in the program. See Appendix B for some of the visualizations generated by the program as well as a brief discussion of problems encountered while using the program.
Since we need an ultra-low vacuum (10^-6 Torr, ten order of magnitude below standard room pressure), two pumps and two pressure gauges are needed. The first stage is a vane pump capable of quickly achieving pressures of 10-1 Torr. A Pirani gauge is used to monitor the pressure from standard to about 10^-2 Torr. At 10^-1 Torr, the second pump, a turbo pump , is activated. This stage can quickly achieve a pressure of 10^-6 Torr. For these pressures, the Pirani gauge is no longer accurate, so we switch to an ion gauge . See Appendix C for more information.

Dielectric Positioning
The dielectric chosen for this project is titanium dioxide ceramic (dielectric constant of 80-100). Polycrystalline titanium dioxide had been used in the first observation of microwave Cerenkov radiation by Danos, et al in 1953. The piece used in this experiment is 25 cm square by 0.5 mm. It was suspended beside the path of the electron beam on a custom mount (similar to the construction of the electron gun).
Titanium dioxide (in its pure form) comes in two distinct structural forms (as seen below). The larger form (on top) is referred to as anatase, while the smaller form is called rutile [16]

Beam Deflection
The electron beam that comes out of the gun is aimed slightly to the right. To correct for this deviation, a steel plate was installed parallel to the dielectric. This plate was in turn connected to a DC power supply that could be controlled by the computer (via GPIB). A simple program in LabWindows allows the user to generate a square wave function of a specific VPP, frequency and DC offset. This was used to generate a pulsed electron beam. At low frequency (compared to the frequency of the radiation) pulsed beam also gives a pulsed radiation signal, thus making it easier to extract the signal from noise in the frequency domain.
Some trials were conducted in SIMION to see if plates as small as that being considered could indeed deflect the beam enough. Based on these constraints, the plate would have to be brought to a few hundred volts to work.
Having the deflection plate gives the user far greater control over the proximity of the beam to the dielectric. With appropriate tuning, a square wave sent to the plate could put the beam very close to the dielectric at the bottom of the signal and then pull the beam more than an inch away from the dielectric at the top of the signal, thus eliminating the possibility of generating any radiation. This deflection system was built and installed, but was not utilized due to difficulties in programming the associated power supply.
According to an earlier plan (set forth in the spring), one using two sets of plates placed just beyond the electron gun, one could both measure the energy of the electron beam, control its positioning,
and "chop" it. While parts of this earlier system were built, this addition to the system was not
completed in time for experimental trials. The theory for the dual deflector, however, was worked out.
We know the energy of an electron beam moving in the x direction can be measured by
passing the electron beam between two plates with a voltage difference between
them. We consider only particles in which
.
This makes the calculations easier, since the particles behavior can be
approximated as non-relativistic. An individual electron experiences a force
of

when it is in an electric field. The electron would therefore experience a
change in momentum of
.
In this case the electric field is perpendicular to the path of the electron;
therefore, the change in momentum is solely in the y
direction. The electric field between the plates is
.
The time the electron passes between the plates is the same no matter how
large E
is since the velocity in the x
direction remains constant. Thus, the time the electron spends between the
plates is

and the momentum of the electron in the y
direction after it passes through the plates is
.
By measuring the distance the particle travels in the x and y direction we
can find
since,

and therefore,

.
For more information, see Appendix D
Sensors
To detect the microwave radiation expected from the setup described above, a microwave diode was used. The diode used is sensitive to X-band microwaves of a certain linear polarization. This band covers frequencies from 8 to 12 GHz (3.75 to 2.4 cm). A separate series of tests with a microwave transmitter of known parameters showed the diode was in fine working order at atmospheric pressure, yielding over 30 mV when aligned correctly with the transmitter. When rotated by 90°, the signal vanishes, as expected.
When the diode was initially placed in the vacuum chamber the noise level was very small (on the order of hundreds of micro-volts). When the pumps were turned on, however, there was a severe increase in the signal. A similar phenomenon was observed during the rapid restoration of pressure at the end of each session; in this scenario the voltage drops dramatically (even going negative). In both cases the voltage slowly travels back towards the background levels.
This sloping is not asymptotic to this level, however, but rather the voltage seems to oscillate about the background (as a heavily damped harmonic oscillator).
Several trials were conducted with the microwave transmitter to determine if this unexpected behavior in any way affected the responsiveness of the diode. For these tests, the diode was placed in the chamber with the dielectric. The microwave source was placed approximately 40 cm from one of the windows on the chamber (approximately 65 cm from the diode itself, with the diode rotated 45° from the path of the microwaves). First the responsiveness of the diode in the chamber at air pressure was tested. For these tests, an external microwave source was used (see picture below).

The increase in diode voltage resulting from being exposed to the microwave source was clear and sharp, with the voltage dropping back to background levels within 0.5 seconds. Then the diode was tested during the pumping sequence and at 10-5 Torr (the pressure at which the gun trials would be conducted). Here too, the diode voltage responded clearly and appropriately.
During the gradual curve in diode voltage immediately following the activation of the vane pump the behavior of the diode voltage while the microwave source was on seemed to show that it was sloping back to the levels set by the microwave source before pumping. This accounts for the difference in voltage increase (increase between background voltages and those when the microwave source is on) between the air pressure and low-pressure tests. The final piece was to test the diode’s response to the activation and modulation of the electron beam. While at low pressure, the gun was activated and the beam was brought to ~2900 V (Variac up to 70%), with no discernable change in diode voltage. A magnet was used to move the beam back and forth, still with no change in diode signal.
After these tests, it was determined that the diode’s behavior during pumping, while unexplained, did not hamper the responsiveness of the diode to an outside microwave source. Given the large response of the diode to the 8mW source used in the trials, one is encouraged that the diode may visibly show the much weaker Cerenkov signal (estimated to be less than the 10-6 W expected by Danos).
For data collection, the diode signal was passed to an HP multimeter that was, in turn, connected via a GPIB cable to a computer for further analysis. This system has a maximum sampling rate of 2 Hz and a measurement precision of ±10 nV.
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